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VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers

Name: VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
ISBN: 9783642420245

Bhupendra Singh Reniwal, Santosh Kumar Vishvakarma (auth.), Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, Dharmendra Boolchandani, Virendra Sing, Adit D. Sing (eds.)

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This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

კატეგორია:

Computers - Hardware

წელი:

2013

გამოცემა:

გამომცემლობა:

Springer-Verlag Berlin Heidelberg

ენა:

english

გვერდები:

388

ISBN 10: